IEEE guide for digital test interchange format (DTIF) application
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IEEE guide for digital test interchange format (DTIF) application

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Published by Institute of Electrical and Electronics Engineers in New York .
Written in English

Subjects:

  • Digital electronics -- Testing -- Standards

Book details:

Edition Notes

StatementSponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
SeriesIEEE Std -- 1546-2000., IEEE std -- 1546-2000.
ContributionsInstitute of Electrical and Electronics Engineers., IEEE Standards Association., IEEE Standards Board., IEEE Standards Coordinating Committee 20.
The Physical Object
Paginationv, 32 p. :
Number of Pages32
ID Numbers
Open LibraryOL21087257M
ISBN 100738126276, 0738126284
OCLC/WorldCa50174091

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